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BS EN IEC 61788-7:2020 Superconductivity - Electronic characteristic measurements. Surface resistance of high-temperature superconductors at microwave frequencies, 2020
- undefined
- Annex ZA(normative)Normative references to international publicationswith their corresponding European publications
- English [Go to Page]
- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Requirements
- 5 Apparatus [Go to Page]
- 5.1 Measurement system
- Figure 1 – Schematic diagram of measurement system for temperature dependence of Rs using a cryocooler
- 5.2 Measurement apparatus for Rs
- Figures [Go to Page]
- Figure 2 – Typical measurement apparatus for Rs
- 5.3 Dielectric rods
- 6 Measurement procedure [Go to Page]
- 6.1 Specimen preparation
- Table 1 – Typical dimensions of pairs of single-crystal sapphire rods for 12 GHz, 18 GHz and 22 GHz
- 6.2 Set-up
- 6.3 Measurement of reference level
- Tables [Go to Page]
- Table 2 – Dimensions of superconductor film for 12 GHz, 18 GHz, and 22 GHz
- 6.4 Measurement of the frequency response of resonators
- Figure 3 – Insertion attenuation, IA, resonant frequency, f0, and half power bandwidth, Δf, measured at T kelvin
- 6.5 Determination of surface resistance of the superconductor and ε′ and tan δ of the standard sapphire rods
- Figure 4 – Reflection scattering parameters (S11 and S22)
- 7 Uncertainty of the test method [Go to Page]
- 7.1 Surface resistance
- Table 3 – Specifications for vector network analyzer
- Table 4 – Specifications for sapphire rods
- 7.2 Temperature
- 7.3 Specimen and holder support structure
- Figure 5 – Term definitions in Table 4
- 7.4 Specimen protection
- 7.5 Uncertainty of surface resistance measured by standard two-resonator method
- 8 Test report [Go to Page]
- 8.1 Identification of test specimen
- 8.2 Report of Rs values
- 8.3 Report of test conditions
- Annex A (informative) Additional information relating to Clauses 1 to 8 [Go to Page]
- A.1 Scope [Go to Page]
- A.1.1 General
- A.1.2 Cylindrical cavity method [10] [17]
- A.1.3 Parallel-plates resonator method [18] [19]
- A.1.4 Microstrip-line resonance method [20] [21]
- A.1.5 Dielectric resonator method [22] [23] [24] [25]
- A.1.6 Image-type dielectric resonator method [26] [27]
- Figure A.1 – Schematic configuration of several measurement methods for the surface resistance [Go to Page]
- A.1.7 Two-resonator method [28] [29]
- A.2 Requirements
- A.3 Theory and calculation equations
- Figure A.2 – Configuration of a cylindrical dielectric rod resonator short-circuited at both ends by two parallel superconductor films deposited on dielectric substrates
- Figure A.3 – Computed results of the u-v and W-v relations for TE01p mode
- A.4 Apparatus
- Figure A.4 – Configuration of standard dielectric rods for measurement of Rs and tan δ
- A.5 Dimensions of the standard sapphire rods
- Figure A.5 – Three types of dielectric resonators
- Figure A.6 – Mode chart to design TE011 resonator short-circuited at both ends by parallel superconductor films [28]
- A.6 Dimension of the closed type resonator
- Figure A.7 – Mode chart to design TE013 resonator short-circuited at both ends by parallel superconductor films [28]
- Figure A.8 – Mode chart for TE011 closed-type resonator [28]
- A.7 Sapphire rod reproducibility
- A.8 Test results
- Figure A.9 – Mode chart for TE013 closed-type resonator [28]
- A.9 Reproducibility of measurement method
- Figure A.10 – Temperature-dependent Rs of YBCO film with a thickness of 500 nm and size of 25 mm square
- A.10 tan δ deviation effect of sapphire rods on surface resistance
- Figure A.11 – Temperature dependent Rs of YBCO film when Rs was measured three times
- Table A.1 – Standard deviation of the surface resistance calculated from the results of Figure A.11
- Table A.2 – Relationship between x, defined by Equation (A.12), and y, defined by Equation (A.13)
- Annex B (informative) Evaluation of relative combined standard uncertainty for surface resistance measurement [Go to Page]
- B.1 Practical surface resistance measurement
- Figure B.1 – Schematic diagram of TE011 and TE013 mode resonance
- B.2 Determination of surface resistance of the superconductor
- Figure B.2 – Typical frequency characteristics of TE011 mode resonance
- B.3 Combined standard uncertainty [Go to Page]
- B.3.1 General
- B.3.2 Calculation of c2 to c5 (12 GHz resonance at 20 K)
- B.3.3 Determination of u1 to u5
- B.3.4 Combined relative standard uncertainty
- Figure B.3 – Frequency characteristics of a resonator approximated by a Lorentz distribution
- Bibliography [Go to Page]
