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PD IEC TR 63170:2018 Measurement procedure for the evaluation of power density related to human exposure to radio frequency fields from wireless communication devices operating between 6 GHz and 100 GHz, 2018
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- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Symbols and abbreviated terms [Go to Page]
- 4.1 Symbols [Go to Page]
- 4.1.1 Physical quantities
- 4.1.2 Constants
- 4.2 Abbreviated terms
- 5 Description of the measurement system [Go to Page]
- 5.1 General
- 5.2 Scanning system
- 5.3 Device holder
- 5.4 Reconstruction algorithms
- 6 Power density assessment [Go to Page]
- 6.1 General
- Figures [Go to Page]
- Figure 1 – Simplified view of a generic measurement setup involvingthe use of reconstruction algorithms
- Figure 2 – Evaluation process overview
- 6.2 Measurement preparation [Go to Page]
- 6.2.1 System check
- Figure 3 – Overview of power density measurement methods [Go to Page]
- 6.2.2 Preparation of the device under test
- 6.2.3 Operating modes
- 6.2.4 Test frequencies for DUT
- 6.2.5 Evaluation surface and DUT test position
- Figure 4 – Illustration of evaluation surface (in black)
- Figure 5 – Illustration of evaluation surface correspondingto the flat phantom surface shape
- 6.3 Tests to be performed
- 6.4 General measurement procedure [Go to Page]
- 6.4.1 General
- Figure 6 – Illustration of evaluation surface corresponding tothe maximum available local or spatial-average power density [Go to Page]
- 6.4.2 Power density assessment based on E- and H-field
- 6.4.3 Power density measurement based on the evaluation of E-field or H-field amplitude only
- 6.5 Measurements of devices with multiple antennas or multiple transmitters [Go to Page]
- 6.5.1 General
- Tables [Go to Page]
- Table 1 – Minimum separation distance between the DUT’s antennaand the evaluation surface for which Formula (3) applies
- Figure 7 – SAR and power density evaluation at a point r [Go to Page]
- 6.5.2 Examples
- 7 Uncertainty estimation [Go to Page]
- 7.1 General considerations
- 7.2 Uncertainty model
- 7.3 Uncertainty components dependent on the measurement system [Go to Page]
- 7.3.1 Calibration of the measurement equipment
- 7.3.2 Probe correction
- 7.3.3 Isotropy
- 7.3.4 Multiple reflections
- 7.3.5 System linearity
- 7.3.6 Probe positioning
- 7.3.7 Sensor location
- 7.3.8 Amplitude and phase drift
- 7.3.9 Amplitude and phase noise
- 7.3.10 Data point spacing
- 7.3.11 Measurement area truncation
- 7.3.12 Reconstruction algorithms
- 7.4 Uncertainty terms dependent on the DUT and environmental factors [Go to Page]
- 7.4.1 Probe coupling with DUT
- 7.4.2 Modulation response
- 7.4.3 Integration time
- 7.4.4 DUT alignment
- 7.4.5 RF ambient conditions
- 7.4.6 Measurement system immunity/secondary reception
- 7.4.7 Drift of DUT
- 7.5 Combined and expanded uncertainty
- Table 2 – Example of measurement uncertainty evaluationtemplate for power density measurements
- 8 Measurement report [Go to Page]
- 8.1 General [Go to Page]
- 8.1.1 General
- 8.1.2 Items to be recorded in the measurement report
- 9 Recommendation for future work [Go to Page]
- 9.1 Measurement standard for EMF compliance assessment of devices operating at frequencies above 6 GHz [Go to Page]
- 9.1.1 General
- 9.1.2 Test frequencies
- 9.1.3 Evaluation surfaces
- 9.1.4 Evaluation of exposure from multiple transmitters
- 9.1.5 Other future work items
- 9.2 Numerical standard for EMF compliance assessment of devices operating at frequencies above 6 GHz
- 9.3 Updates to IEC 62232
- Annex A (informative)Measurement system check and validation [Go to Page]
- A.1 Background [Go to Page]
- A.1.1 General
- A.1.2 Objectives of system check
- A.1.3 Objectives of system validation
- A.2 Measurement setup and procedure for system check and system validation [Go to Page]
- A.2.1 General
- A.2.2 Power measurement setups
- Figure A.1 – A recommended power measurement setup for system checkand system validation [Go to Page]
- A.2.3 Procedure to normalize the measured power density
- A.3 System check [Go to Page]
- A.3.1 System check sources and test conditions
- A.3.2 Test procedure
- A.4 System validation [Go to Page]
- A.4.1 Reference sources and test conditions
- A.4.2 System validation procedure
- Annex B (informative)Examples of reference sources [Go to Page]
- B.1 Background
- B.2 Cavity-fed dipole arrays [Go to Page]
- B.2.1 Description
- Figure B.1 – Main dimensions for the cavity-backed array of dipoles
- Table B.1 – Main dimensions for the cavity-backed dipole arrayat each frequency of interest [Go to Page]
- B.2.2 Target values
- Table B.2 – Target values for the cavity-backed dipole arraysat different frequencies (us (k = 1) = 0,5 dB)
- Figure B.2 – 10 GHz patterns for the |Etotal| and Re{S}total for the cavity-backed array of dipoles at various distances, d, from the upper surface of the dielectric substrate
- Figure B.3 – 30 GHz patterns for the |Etotal| and Re{S}total for the cavity-backed array of dipoles at various distances, d, from the upper surface of the dielectric substrate
- Figure B.4 – 60 GHz patterns for the |Etotal| and Re{S}total for the cavity-backed array of dipoles at various distances, d, from the upper surface of the dielectric substrate
- Figure B.5 – 90 GHz patterns for the |Etotal| and Re{S}total for the cavity-backed array of dipoles at various distances, d, from the upper surface of the dielectric substrate
- B.3 Pyramidal horns loaded with a slot array [Go to Page]
- B.3.1 Description
- Figure B.6 – Main dimensions for the 0,15 mm stainless steel stencil with slot array
- Figure B.7 – Main dimensions for the pyramidal horn antennas [Go to Page]
- B.3.2 Target values
- Table B.3 – Main dimensions for the stencil with slot array for each frequency
- Table B.4 – Main dimensions for the corresponding pyramidal horn at each frequency
- Table B.5 – Target values for the pyramidal horns loaded with slot arrays at different frequencies (us (k = 1) = 0,5 dB)
- Figure B.8 – 10 GHz patterns for the |Etotal| and Re{S}total for the pyramidal horn loaded with an array of slots at various distances, d, from the array surface and Pin = 0 dBm
- Figure B.9 – 30 GHz patterns for the |Etotal| and Re{S}total for the pyramidal horn loaded with an array of slots at various distances, d, from the array surface and Pin = 0 dBm
- Figure B.10 – 60 GHz patterns for the |Etotal| and Re{S}total for the pyramidal horn loaded with an array of slots at various distances, d, from the upper surfaceof the slot array
- Figure B.11 – 90 GHz patterns for the |Etotal| and Re{S}total for the pyramidal horn loaded with an array of slots at various distances, d, from the upper surfaceof the slot array
- Annex C (informative)Examples of system check sources [Go to Page]
- C.1 Background
- C.2 Source description
- C.3 Target values
- Table C.1 – Target values for pyramidal horn antennas at different frequencies
- Annex D (informative)Information on the applicability of far-field methods [Go to Page]
- D.1 Background
- D.2 Evaluation method using EIRP [Go to Page]
- D.2.1 General
- D.2.2 Numerical simulated results
- Figure D.1 – Antenna models at 28,5 GHz
- Figure D.2 – Seirp compared to Sav (normalized to maximum of Seirp)
- D.3 Plane wave equivalent approximation [Go to Page]
- D.3.1 General
- D.3.2 Numerical simulated results
- Figure D.3 – Plane wave equivalent approximation (Se) and simulation (Sav) results
- Figure D.4 – Difference of Se to Sav for all antennas (%)
- Annex E (informative)Rationale for the use of square or circular shapes for the averaging area applied to the power density for compliance evaluation [Go to Page]
- E.1 General
- E.2 Method using computational analysis
- E.3 Areas averaged with square and circular shapes
- Figure E.1 – Schematic view of the assessment of the variationof Sav using square shape by rotating AUT
- Figure E.2 – Comparison of maximum valuesof Sav averaged toward square and circular shapes
- Annex F (informative)Near field reconstruction algorithms [Go to Page]
- F.1 General
- F.2 Field expansion methods [Go to Page]
- F.2.1 General
- F.2.2 The plane wave spectrum expansion
- Figure F.1 – Comparison of maximum values of Sav betweenthe computational simulation and back projection at 30 GHz
- F.3 Inverse source methods
- Figure F.2 – Comparison of maximum values of Sav betweenthe computational simulation and back projection at 60 GHz
- F.4 Implementation scenarios [Go to Page]
- F.4.1 General
- F.4.2 Alternative field measurements
- F.4.3 Phase-less approaches
- F.4.4 Direct or quasi-direct near field measurements
- Annex G (informative)Example of a mixed (numerical and experimental) approachto assess EMF compliance for a WiGig device [Go to Page]
- G.1 General
- G.2 Approach used to assess conformance
- Figure G.1 – Evaluation plane and antenna position
- Figure G.2 – Local and spatial-average power densities in mW/cm2
- Table G.1 – Phase shifts between antenna elements leadingto the maximum power density for each channel
- G.3 Conclusion
- Figure G.3 – Spatial-average power densities variationwith the distance from evaluation plane
- Figure G.4 – Correlation (simulation vs. measurement)
- Annex H (informative)Use cases [Go to Page]
- H.1 General
- Figure H.1 – Picture of the mock-up used for power density measurements
- H.2 Configurations
- Figure H.2 – Antenna geometry
- Figure H.3 – Picture of the mock-up numerical model
- H.3 Results obtained at Laboratory 1 [Go to Page]
- H.3.1 General
- H.3.2 Miniaturized probe
- H.3.3 Scans
- Table H.1 – Phase shift values for the mockup antenna ports.
- Figure H.4 – Illustration of the angles used for the numerical descriptionof the sensor and the orientation of an ellipse in 3-D space [Go to Page]
- H.3.4 Total field and power density reconstruction
- H.3.5 Power density averaging
- Figure H.5 – Numerical algorithm for reconstructing the ellipse parameters [Go to Page]
- H.3.6 Measuring setup
- Figure H.6 – Measuring setup used at Laboratory 1
- Table H.2 – Measured power at the end of the adapter 2,4 mm to 3,5 mm and input power at the antenna port after considering extra losses introduced by thesemi-rigid 200 mm coaxial cable and connectors [Go to Page]
- H.3.7 Simulated results
- H.3.8 Measured results
- Figure H.7 – DUT while measuring showing the numbering for the ports
- Table H.3 – Edge length of the scanned planes for the different configurations
- Figure H.8 – Simulated (left) and measured (right) power density distributionfor the TOP configuration
- Figure H.9 – Simulated (left) and measured (right) power density distributionfor the FRONT configuration
- Figure H.10 – Averaged power density as a function of distance for port 1, at 27,925 GHz, for TOP and FRONT configurations averaged over an area of 4 cm2
- Figure H.11 – Averaged power density as a function of averaging area for port 1at different frequencies
- H.4 Results obtained at Laboratory 2 [Go to Page]
- H.4.1 General
- H.4.2 Measurement setup
- Figure H.12 – Distribution of the power density corresponding to the arraywith zero phase-shift between elements (configuration w1 of Table H.1) [Go to Page]
- H.4.3 Data processing
- H.4.4 Numerical simulations and comparison with measurements
- Figure H.13 –Mock-up with antenna port number 2 connected to the VNA (left)and the open waveguide probe and alignment system (right)
- Figure H.14 – Simulated (left) and measured (right) power density distributionfor the TOP configuration over a 15 cm x 15 cm plane
- Figure H.15 – Simulated (left) and measured (right) power density distributionfor the FRONT configuration over a 15 cm x 15 cm plane
- Figure H.16 – Averaged power density as a function of distance for port 1, at 27,925 GHz, for TOP and FRONT configurations averaged over an area of 4 cm2
- Figure H.17 – Averaged power density as a function of averaging area for port 1at different frequencies
- H.5 Measurements at Laboratory 3 [Go to Page]
- H.5.1 General
- H.5.2 Measurement setup
- Figure H.18 – Distribution of the power density corresponding to the arraywith zero phase-shift between elements (configuration w1 of Table H.1) [Go to Page]
- H.5.3 Scans
- Figure H.19 – Measurement setup
- Bibliography [Go to Page]
