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IEC 62586-2 Ed. 2.0 en:2017 Power quality measurement in power supply systems - Part 2: Functional tests and uncertainty requirements, 2017
- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms, definitions, abbreviated terms, notations and symbols [Go to Page]
- 3.1 General terms and definitions
- 3.2 Terms and definitions related to uncertainty
- 3.3 Notations [Go to Page]
- 3.3.1 Functions
- 3.3.2 Symbols and abbreviated terms
- 3.3.3 Indices
- 4 Requirements [Go to Page]
- 4.1 Requirements for products complying with class A
- 4.2 Requirements for products complying with class S
- 5 Functional type tests common requirements [Go to Page]
- 5.1 General philosophy for testing [Go to Page]
- 5.1.1 System topology
- 5.1.2 Stabilization time
- 5.1.3 Measuring ranges
- 5.1.4 Single "power-system influence quantities"
- 5.1.5 "External influence quantities"
- 5.1.6 Test criteria
- 5.2 Testing procedure [Go to Page]
- 5.2.1 Device under test
- 5.2.2 Testing conditions
- 5.2.3 Testing equipment
- 6 Functional testing procedure for instruments complying with class A according to IEC 61000-4-30 [Go to Page]
- 6.1 Power frequency [Go to Page]
- 6.1.1 General
- 6.1.2 Measurement method
- 6.1.3 Measurement uncertainty and measuring range
- 6.1.4 Measurement evaluation
- 6.1.5 Measurement aggregation
- 6.2 Magnitude of supply voltage [Go to Page]
- 6.2.1 Measurement method
- 6.2.2 Measurement uncertainty and measuring range
- 6.2.3 Measurement evaluation
- 6.2.4 Measurement aggregation
- 6.3 Flicker
- 6.4 Supply voltage interruptions, dips and swells [Go to Page]
- 6.4.1 General
- 6.4.2 Check dips / interruptions in polyphase system
- 6.4.3 Check swells in polyphase system
- 6.5 Supply voltage unbalance [Go to Page]
- 6.5.1 General
- 6.5.2 Measurement method, measurement uncertainty and measuring range
- 6.5.3 Aggregation
- 6.6 Voltage harmonics [Go to Page]
- 6.6.1 Measurement method
- 6.6.2 Measurement uncertainty and measuring range
- 6.6.3 Measurement evaluation
- 6.6.4 Measurement aggregation
- 6.7 Voltage interharmonics [Go to Page]
- 6.7.1 Measurement method
- 6.7.2 Measurement uncertainty and measuring range
- 6.7.3 Measurement evaluation
- 6.7.4 Measurement aggregation
- 6.8 Mains signalling voltages on the supply voltage [Go to Page]
- 6.8.1 Measurement method
- 6.8.2 Measurement uncertainty and measuring range
- 6.8.3 Aggregation
- 6.9 Measurement of underdeviation and overdeviation parameters [Go to Page]
- 6.9.1 Measurement method
- 6.9.2 Measurement uncertainty and measuring range
- 6.9.3 Measurement evaluation
- 6.9.4 Measurement aggregation
- 6.10 Flagging
- 6.11 Clock uncertainty testing
- 6.12 Variations due to external influence quantities [Go to Page]
- 6.12.1 General
- 6.12.2 Influence of temperature
- 6.12.3 Influence of power supply voltage
- 6.13 Rapid voltage changes (RVC) [Go to Page]
- 6.13.1 RVC parameters and evaluation
- 6.13.2 General
- 6.13.3 “No RVC” tests
- 6.13.4 “RVC threshold and setup” test
- 6.13.5 “RVC parameters” test
- 6.13.6 “RVC polyphase” tests
- 6.13.7 “Voltage is in steady-state condition” tests
- 6.14 Magnitude of current
- 6.15 Harmonic current
- 6.16 Interharmonic currents
- 6.17 Current unbalance [Go to Page]
- 6.17.1 General
- 6.17.2 Measurement method, measurement uncertainty and measuring range
- 7 Functional testing procedure for instruments complying with class S according to IEC 61000-4-30 [Go to Page]
- 7.1 Power frequency [Go to Page]
- 7.1.1 General
- 7.1.2 Measurement method
- 7.1.3 Measurement uncertainty and measuring range
- 7.1.4 Measurement evaluation
- 7.1.5 Measurement aggregation
- 7.2 Magnitude of the supply voltage [Go to Page]
- 7.2.1 Measurement method
- 7.2.2 Measurement uncertainty and measuring range
- 7.2.3 Measurement evaluation
- 7.2.4 Measurement aggregation
- 7.3 Flicker
- 7.4 Supply voltage interruptions, dips and swells [Go to Page]
- 7.4.1 General requirements
- 7.4.2 Check dips / interruptions in polyphase system
- 7.4.3 Check swells in polyphase system
- 7.5 Supply voltage unbalance [Go to Page]
- 7.5.1 General
- 7.5.2 Measurement method, measurement uncertainty and measuring range
- 7.5.3 Aggregation
- 7.6 Voltage harmonics [Go to Page]
- 7.6.1 General
- 7.6.2 Measurement method
- 7.6.3 Measurement method, measurement uncertainty and measuring range
- 7.6.4 Measurement evaluation
- 7.6.5 Measurement aggregation
- 7.7 Voltage interharmonics
- 7.8 Mains signalling voltages on the supply voltage [Go to Page]
- 7.8.1 General
- 7.8.2 Measurement method
- 7.8.3 Measurement uncertainty and measuring range
- 7.8.4 Aggregation
- 7.9 Measurement of underdeviation and overdeviation parameters
- 7.10 Flagging
- 7.11 Clock uncertainty testing
- 7.12 Variations due to external influence quantities [Go to Page]
- 7.12.1 General
- 7.12.2 Influence of temperature
- 7.12.3 Influence of power supply voltage
- 7.13 Rapid voltage changes
- 7.14 Magnitude of current
- 7.15 Harmonic current
- 7.16 Interharmonic currents
- 7.17 Current unbalance [Go to Page]
- 7.17.1 General
- 7.17.2 Measurement method, measurement uncertainty and measuring range
- 8 Calculation of measurement uncertainty and operating uncertainty
- Annex A (normative)Intrinsic uncertainty and operating uncertainty, [Go to Page]
- A.1 General
- A.2 Measurement uncertainty
- A.3 Operating uncertainty
- Annex B (informative)Overall system uncertainty
- Annex C (normative)Calculation of measurement and operating uncertaintyfor voltage magnitude and power frequency [Go to Page]
- C.1 Selection of test points to verify operating uncertainty and uncertainty under reference conditions
- C.2 Class A calculation examples [Go to Page]
- C.2.1 General
- C.2.2 Parameter: magnitude of supply voltage, Udin = 230 V, 50/60Hz, rated range of temperature −25 °C to +55 °C
- C.2.3 Parameter: power frequency 50/60 Hz, rated range of temperature −25 °C to +55 °C
- Annex D (informative)Further test on dips (amplitude and phase angles changes) [Go to Page]
- D.1 Phase-to-phase or phase-to-neutral testing
- D.2 Test method
- Annex E (informative)Further tests on dips (polyphase): test procedure [Go to Page]
- E.1 General
- E.2 Phase voltage dips and interruptions
- E.3 Phase swells
- Annex F (normative)Gapless measurements of voltage amplitude and harmonics test [Go to Page]
- F.1 Purpose of the test
- F.2 Test set up
- F.3 Voltage amplitude [Go to Page]
- F.3.1 Test signal
- F.3.2 Result evaluation
- F.4 Harmonics [Go to Page]
- F.4.1 Test signal
- F.4.2 Result evaluation
- F.5 Inter-harmonics [Go to Page]
- F.5.1 Test signal
- F.5.2 Result evaluation
- Annex G (informative)Gapless measurements of voltage amplitude and harmonics
- Annex H (informative)Testing equipment recommendations [Go to Page]
- H.1 Testing range
- H.2 Uncertainty and stability of source and reference meter [Go to Page]
- H.2.1 Uncertainty of source and reference meter
- H.2.2 Stability of the source
- H.3 Time synchronisation
- H.4 Power quality functions of source and reference meter
- H.5 Traceability
- Annex I (informative)Recommendations related to a declarationof conformity (DoC) and a test report [Go to Page]
- I.1 Definitions
- I.2 Recommendations
- I.3 Example of IEC 62586-1 declaration of conformity
- I.4 Example of IEC 62586-2 declaration [Go to Page]
- I.4.1 General
- I.4.2 Recommendation for IEC 62586-2 test report
- I.4.3 Recommendation for IEC 62586-2 test summary
- I.4.4 Recommendation for IEC 62586-2 test equipment information
- I.4.5 Recommendation for IEC 62586-2 tested functions
- Bibliography
- Figures [Go to Page]
- Figure 1 – Overview of test for dips according to test A4.1.1
- Figure 2 – Detail 1 of waveform for test of dips according to test A4.1.1
- Figure 3 – Detail 2 of waveform for tests of dips according to A4.1.1
- Figure 4 – Detail 3 of waveform for tests of dips according to test A4.1.1
- Figure 5 – Detail 1 of waveform for test of dips according to test A4.1.2
- Figure 6 – Detail 2 of waveform for tests of dips according to test A4.1.2
- Figure 7 – Detail 1 of waveform for test of swells according to test A4.1.2
- Figure 8 – Detail 2 of waveform for tests of swells according to test A4.1.2
- Figure 9 – Sliding reference voltage test
- Figure 10 – Sliding reference start up condition
- Figure 11 – Detail 1 of waveform for test of polyphase dips/interruptions
- Figure 12 – Detail 2 of waveform for test of polyphase dips/interruptions
- Figure 13 – Detail 3 of waveform for test of polyphase dips/interruptions
- Figure 14 – Detail 1 of waveform for test of polyphase swells
- Figure 15 – Detail 2 of waveform for test of polyphase swells
- Figure 16 – Flagging test for class A
- Figure 17 – Clock uncertainty testing
- Figure 18 – Example of RVC event
- Figure 19 – A13.1.1 waveform
- Figure 20 – A13.1.1 waveform with RVC limits and arithmetic mean
- Figure 21 – A13.1.2 waveform
- Figure 22 – A13.1.2 waveform with RVC limits and arithmetic means
- Figure 23 – A13.1.3 waveform
- Figure 24 – A13.1.3 waveform with RVC limits and arithmetic mean
- Figure 25 – A13.2.1 waveform
- Figure 26 – A13.2.1 waveform with RVC limits and arithmetic mean
- Figure 27 – A13.3.1 waveform
- Figure 28 – A13.3.1 waveform with RVC limits and arithmetic mean
- Figure 29 – A13.4.1 waveform
- Figure 30 – A13.5.1 waveform
- Figure 31 –A13.5.1 waveform with RVC limits and arithmetic mean
- Figure 32 – A13.5.2 waveform
- Figure 33 – A13.5.2 waveform with RVC limits and arithmetic mean
- Figure 34 – Detail 1 of waveform for test of dips according to test S4.1.2
- Figure 35 – Detail 2 of waveform for tests of dips according to test S4.1.2
- Figure 36 – Detail 1 of waveform for test of swells according to test S4.1.2
- Figure 37 – Detail 2 of waveform for tests of swells according to test S4.1.2
- Figure 38 – Sliding reference voltage test
- Figure 39 – Sliding reference start-up condition
- Figure 40 – Detail 1 of waveform for test of polyphase dips/interruptions
- Figure 41 – Detail 2 of waveform for test of polyphase dips/interruptions
- Figure 42 – Detail 3 of waveform for test of polyphase dips/interruptions
- Figure 43 – Detail 1 of waveform for test of polyphase swells
- Figure 44 – Detail 2 of waveform for test of polyphase swells
- Figure 45 – Flagging test for class S
- Figure 46 – Clock uncertainty testing
- Figure A.1 – Different kinds of uncertainties
- Figure D.1 – Phase-to-neutral testing on three-phase systems
- Figure D.2 – Phase-to-phase testing on three-phase systems
- Figure E.1 – Example for one phase of a typical N cycle injection
- Figure E.2 – Dip/interruption accuracy (amplitude and timing) test
- Figure E.3 – Swell accuracy (amplitude and timing) test
- Figure G.1 – Simulated signal under noisy conditions
- Figure G.2 – Waveform for checking gapless RMS voltage measurement
- Figure G.3 – 2,3 Hz frequency fluctuation
- Figure G.4 – Spectral leakage effects for a missing sample
- Figure G.5 – Illustration of QRMS for missing samples
- Figure G.6 – Detection of a single missing sample
- Figure G.7 – QRMS for an ideal signal, sampling error = −300 × 10−6
- Figure G.8 – QRMS for an ideal signal, sampling error = 400 × 10−6
- Figure G.9 – QRMS for an ideal signal, sampling error = 200 × 10−6
- Figure G.10 – QH(5) with ideal test signal and perfect samplingfrequency synchronization
- Figure G.11 – QH(5) with 300 × 10−6 sampling frequency error and 100 × 10−6 modulation frequency error
- Figure G.12 – QRMS with a 20/24-cycle sliding window with an output every 10/12 cycles
- Figure G.13 – Amplitude test for fluctuating component
- Tables [Go to Page]
- Table 1 – Summary of type tests for class A
- Table 2 – Summary of type tests for class S
- Table 3 – Testing points for each measured parameter
- Table 4 – List of single "power-system influence quantities"
- Table 5 – Influence of temperature
- Table 6 – Influence of auxiliary power supply voltage
- Table 7 – List of generic test criteria
- Table 8 – Specification of test A13.1.1
- Table 9 – Specification of test A13.1.2
- Table 10 – Specification of test A13.1.3
- Table 11 – Specification of test A13.2.1
- Table 12 – Specification of test A13.3.1
- Table 13 – Specification of test A13.4.1
- Table 14 – Specification of test A13.5.1
- Table 15 – Specification of test A13.5.2
- Table 16 – Uncertainty requirements
- Table D.1 – Tests pattern
- Table H.1 – Testing range
- Table H.2 – Uncertainty of source and reference meter
- Table H.3 – Stability of source
- Table I.1 – Example of a DoC related to compliance with IEC 62586-1
- Table I.2 – Example of DoC related to compliance with IEC 62586-2 [Go to Page]
