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ISO/IEC 18046-3:2020 Information technology - Radio frequency identification device performance test methods - Part 3: Test methods for tag performance, 2020
- Foreword
- Introduction
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Symbols and abbreviated terms
- 4.1 Symbols
- 4.2 Abbreviated terms
- 5 Conditions applicable to the test methods
- 5.1 Number of tags to be tested
- 5.2 Test environment
- 5.3 RF environment
- 5.4 Pre-conditioning
- 5.5 Default tolerance
- 5.6 Total measurement uncertainty
- 5.7 Test result reporting
- 5.8 Test mounting material
- 5.9 Test communication parameters
- 5.10 Test equipment limitations
- 5.11 Human exposure to EMF
- 6 Setup of test equipment for tag test
- 6.1 Test apparatus and test circuits for ISO/IEC 18000-2 tags
- 6.2 Test apparatus and test circuits for ISO/IEC 18000-3 tags
- 6.3 Test apparatus and test circuits for ISO/IEC 18000-61, ISO/IEC 18000-62, ISO/IEC 18000-63 and ISO/IEC 18000-64 tags
- 6.3.1 Propagative UHF tags measurement
- 6.3.2 Inductive UHF tags measurement
- 6.4 Test apparatus and test circuits for ISO/IEC 18000-7 tags
- 7 Functional tests for inductive tags as defined in ISO/IEC 18000-2 and ISO/IEC 18000-3, ISO/IEC 18000-61, ISO/IEC 18000-62, ISOIEC 18000-63 and ISO/IEC 18000-64
- 7.1 Identification magnetic field threshold (HTHR Identification)
- 7.1.1 Purpose
- 7.1.2 Test procedure
- 7.2 Reading magnetic field threshold (HTHR Read)
- 7.2.1 Purpose
- 7.2.2 Test procedure
- 7.2.3 Test report
- 7.3 Writing magnetic field threshold (HTHR Write)
- 7.3.1 Purpose
- 7.3.2 Test procedure
- 7.4 Maximum operating magnetic field (HMax)
- 7.4.1 Purpose
- 7.4.2 Test procedure
- 7.5 Survival magnetic field (HSurvival)
- 7.5.1 Purpose
- 7.5.2 Test procedure
- 7.6 Load modulation (LM)
- 7.6.1 Purpose
- 7.6.2 Test procedure
- 7.7 Optional resonant frequency and Q factor measurement for inductive tag
- 7.7.1 Purpose
- 7.7.2 Test procedure
- 8 Functional tests for propagative tags as defined in ISO/IEC 18000-61, ISO/IEC 18000-62, ISO/IEC 18000-63 and ISO/IEC 18000-64
- 8.1 Minimum power operation threshold (PMin) for identification, read and write
- 8.1.1 Purpose
- 8.1.2 Test procedure
- 8.1.3 Test report
- 8.2 Sensitivity degradation (SDegradation)
- 8.2.1 Purpose
- 8.2.2 Test procedure
- 8.2.3 Test report
- 8.3 Maximum operating power of tag (PMax)
- 8.3.1 Purpose
- 8.3.2 Test procedure
- 8.3.3 Test report
- 8.4 Survival electromagnetic power of tag (PSurvial)
- 8.4.1 Purpose
- 8.4.2 Test procedure
- 8.4.3 Test report
- 8.5 Interference rejection (IRejection)
- 8.5.1 Purpose
- 8.5.2 Test procedure
- 8.5.3 Test report
- 8.6 Maximum fade rate (PMin,Fade)
- 8.6.1 Purpose
- 8.6.2 Test procedure
- 8.6.3 Test report
- 9 Functional tests for 433,920 MHz propagative tags as defined in ISO/IEC 18000-7
- 9.1 Identification electromagnetic field threshold (ETHR Identification) and frequency tolerance
- 9.1.1 Purpose
- 9.1.2 Test procedure
- 9.1.3 Test report
- 9.2 Reading electromagnetic field threshold (ETHR Read) and frequency tolerance
- 9.2.1 Purpose
- 9.2.2 Test procedure
- 9.2.3 Test report
- 9.3 Writing electromagnetic field threshold (ETHR Write)
- 9.3.1 Purpose
- 9.3.2 Test procedure
- 9.3.3 Test report
- 9.4 Sensitivity Directivity (SDirectivity)
- 9.4.1 Purpose
- 9.4.2 Test procedure
- 9.4.3 Test report
- 9.5 Interference rejection (IRejection)
- 9.5.1 Purpose
- 9.5.2 Test procedure
- 9.5.3 Test report
- 9.6 Maximum operating electromagnetic field (EMax)
- 9.6.1 Purpose
- 9.6.2 Test procedure
- 9.6.3 Test report
- 9.7 Survival electromagnetic field (ESurvival)
- 9.7.1 Purpose
- 9.7.2 Test procedure
- 9.7.3 Test report
- Annex A (informative) Resonant frequency and Q factor measurement for inductive tag
- Annex B (normative) Test apparatus modification for ISO/IEC 18000-3 tags for field strengths >5 A/m
- Annex C (normative) Test apparatus modification for ISO/IEC 18000-61, ISO/IEC 18000-62, ISO/IEC 18000-63 and ISO/IEC 18000-64 tags
- Annex D (informative) Inventory command for all parts of ISO/IEC 18000
- Annex E (normative) Backscatter power measurement
- Bibliography [Go to Page]