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BS ISO 17987-7:2016 Road vehicles. Local Interconnect Network (LIN) - Electrical Physical Layer (EPL) conformance test specification >
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BS ISO 17987-7:2016 Road vehicles. Local Interconnect Network (LIN) - Electrical Physical Layer (EPL) conformance test specification, 2016
- Foreword
- Introduction
- 1 Scope
- 2 Normative references
- 3 Terms, definitions, symbols and abbreviated terms
- 3.1 Terms and definitions
- 3.2 Symbols
- 3.3 Abbreviated terms
- 4 Conventions
- 5 EPL 12 V LIN devices with RX and TX access
- 5.1 Test specification overview
- 5.1.1 Test case organization
- 5.1.2 Measurement and signal generation requirements
- 5.2 Operational conditions — Calibration
- 5.2.1 Electrical input/output, LIN protocol
- 5.2.2 [EPL–CT 1] Operating voltage range
- 5.2.3 Threshold voltages
- 5.2.4 [EPL–CT 5] Variation of VSUP_NON_OP
- 5.2.5 IBUS under several conditions
- 5.2.6 Slope control
- 5.2.7 Propagation delay
- 5.2.8 Supply voltage offset
- 5.2.9 Failure
- 5.2.10 [EPL–CT 22] Verifying internal capacitance and dynamic interference — IUT as slave
- 5.3 Operation mode termination
- 5.3.1 General
- 5.3.2 [EPL–CT 23] Measuring internal resistor — IUT as slave
- 5.3.3 [EPL–CT 24] Measuring internal resistor — IUT as master
- 5.4 Static test cases
- 6 EPL 12 V LIN devices without RX and TX access
- 6.1 Test specification overview
- 6.2 Communication scheme
- 6.2.1 General
- 6.2.2 IUT as slave
- 6.2.3 IUT as master
- 6.2.4 IUT class C device
- 6.3 Test case organization
- 6.4 Measurement and signal generation — Requirements
- 6.4.1 Data generation
- 6.4.2 Various requirements
- 6.5 Operational conditions — Calibration
- 6.5.1 Electrical input/output, LIN protocol
- 6.5.2 [EPL–CT 25] Operating voltage range
- 6.5.3 Threshold voltages
- 6.5.4 [EPL–CT 29] Variation of VSUP_NON_OP ∈ [–0,3 V to 7,0 V], [18 V to 40 V]
- 6.5.5 IBUS under several conditions
- 6.5.6 Slope control
- 6.5.7 [EPL–CT 35] Propagation delay
- 6.5.8 Supply voltage offset
- 6.5.9 Failure
- 6.5.10 [EPL–CT 48] Verifying internal capacitance and dynamic interference — IUT as slave
- 6.6 Operation mode termination
- 6.6.1 General
- 6.6.2 [EPL–CT 49] Measuring internal resistor — IUT as slave
- 6.6.3 [EPL–CT 50] Measuring internal resistor — IUT as master
- 6.7 Static test cases
- 7 EPL 24 V LIN devices with RX and TX access
- 7.1 Test specification overview
- 7.1.1 Test case organization
- 7.1.2 Measurement and signal generation — Requirements
- 7.2 Operational conditions — Calibration
- 7.2.1 Electrical input/output, LIN protocol
- 7.2.2 [EPL–CT 51] Operating voltage range
- 7.2.3 Threshold voltages
- 7.2.4 [EPL–CT 55] Variation of VSUP_NON_OP
- 7.2.5 IBUS under several conditions
- 7.2.6 Slope control
- 7.2.7 Propagation delay
- 7.2.8 Supply voltage offset
- 7.2.9 Failure
- 7.2.10 [EPL–CT 80] Verifying internal capacitance and dynamic interference — IUT as slave
- 7.3 Operation mode termination
- 7.3.1 General
- 7.3.2 [EPL–CT 81] Measuring internal resistor — IUT as slave
- 7.3.3 [EPL–CT 82] Measuring internal resistor — IUT as master
- 7.4 Static test cases
- 8 EPL 24 V LIN devices without RX and TX access
- 8.1 Test specification overview
- 8.2 Communication scheme
- 8.2.1 Overview
- 8.2.2 IUT as slave
- 8.2.3 IUT as master
- 8.2.4 IUT Class C device
- 8.3 Test case organization
- 8.4 Measurement and signal generation — Requirements
- 8.4.1 Data generation
- 8.4.2 Various requirements
- 8.5 Operational conditions — Calibration
- 8.5.1 Electrical input/output, LIN protocol
- 8.5.2 [EPL–CT 83] Operating voltage range
- 8.5.3 Threshold voltages
- 8.5.4 [EPL–CT 87] Variation of VSUP_NON_OP ∈ [–0,3 V to 7,0 V], [18 V to 58 V]
- 8.5.5 IBUS under several conditions
- 8.5.6 Slope control
- 8.5.7 [EPL–CT 93] Propagation delay
- 8.5.8 Supply voltage offset
- 8.5.9 Failure
- 8.5.10 [EPL–CT 106] Verifying internal capacitance and dynamic interference — IUT as slave
- 8.6 Operation mode termination
- 8.6.1 General
- 8.6.2 [EPL–CT 107] Measuring internal resistor — IUT as slave
- 8.6.3 [EPL–CT 108] Measuring internal resistor — IUT as master
- 8.7 Static test cases
- Bibliography [Go to Page]